SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Materials and Devices for Sensing and Imaging II - Direct phase modulating laser diode interferometer for in-process measurement using sinusoidal signal synchronized with the CCD camera's exposure time
Zhao, Xuefeng, Wang, Anbo, Zhang, Yimo, Suzuki, Takamasa, Masutomi, Takamasa, Ishii, Yukihiro, Sasaki, OsamiVolume:
5633
Year:
2004
Language:
english
DOI:
10.1117/12.603826
File:
PDF, 161 KB
english, 2004