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SPIE Proceedings [SPIE Defense and Security - Orlando, Florida, USA (Monday 28 March 2005)] Optical Pattern Recognition XVI - Resolution limits for time-of-flight imaging laser radar
Khoury, Jed, Casasent, David P., Chao, Tien-Hsin, Woods, Charles L., Lorenzo, Joseph, Kierstead, JohnVolume:
5816
Year:
2005
Language:
english
DOI:
10.1117/12.604178
File:
PDF, 63 KB
english, 2005