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SPIE Proceedings [SPIE Semiconductors '92 - Somerset, NJ (Sunday 22 March 1992)] Spectroscopic Characterization Techniques for Semiconductor Technology IV - Direct measurement of the piezoelectric field and Fermi level pinning in [111]B grown InGaAs/GaAs heterostructures
Dutta, Mitra B., Glembocki, Orest J., Shen, Hongen, Pamulapati, Jagadeesh, Chang, Wayne H., Stroscio, Michael A., Zhang, Xiaoqiang, Kim, D. M., Chung, K. W., Ruden, P. P., Nathan, Marshall I.Volume:
1678
Year:
1992
Language:
english
DOI:
10.1117/12.60457
File:
PDF, 318 KB
english, 1992