SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Optical Diagnostics - Molecular Rayleigh scattering diagnostic for measurement of high frequency temperature fluctuations
Mielke, Amy F., Hanssen, Leonard M., Farrell, Patrick V., Elam, Kristie A.Volume:
5880
Year:
2005
Language:
english
DOI:
10.1117/12.615415
File:
PDF, 2.12 MB
english, 2005