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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy II - Ultra-high accuracy optical testing: creating diffraction-limited short-wavelength optical systems
Goldberg, Kenneth A., Citterio, Oberto, O'Dell, Stephen L., Naulleau, Patrick P., Rekawa, Senajith B., Denham, Paul E., Liddle, J. A., Gullikson, Eric M., Jackson, Keith H., Anderson, Erik H., Taylor,Volume:
5900
Year:
2005
DOI:
10.1117/12.618066
File:
PDF, 1.58 MB
2005