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SPIE Proceedings [SPIE Optics & Photonics 2005 - San Diego, California, USA (Sunday 31 July 2005)] Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications - Temporally-resolved area-imaged velocimeter system for dynamic materials experiments
Tierney IV, Thomas E., Swift, Damian C., Vigil, Billy N., Paisley, Dennis L., Luo, Sheng-Nian, Johnson, Randall P., Letzring, Samuel A.Volume:
5920
Year:
2005
Language:
english
DOI:
10.1117/12.622285
File:
PDF, 1.05 MB
english, 2005