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SPIE Proceedings [SPIE Remote Sensing - Bruges, Belgium (Monday 19 September 2005)] Lidar Technologies, Techniques, and Measurements for Atmospheric Remote Sensing - Analytically derived thermal correction to reduce overlap bias errors in micro-pulse lidar data
Berkoff, Timothy A., Singh, Upendra N., Ji, Qiang, Reid, Elizabeth, Valencia, Sandra, Welton, Ellsworth J., Spinhirne, James D.Volume:
5984
Year:
2005
Language:
english
DOI:
10.1117/12.627737
File:
PDF, 805 KB
english, 2005