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SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Intelligent Systems in Design and Manufacturing VI - Integrated quality assurance for assembly and testing of complex structures
von Kopylow, Christoph, Gopalakrishnan, Bhaskaran, Bothe, Thorsten, Elandaloussi, Frank, Kalms, Michael, Jüptner, WernerVolume:
5999
Year:
2005
Language:
english
DOI:
10.1117/12.630726
File:
PDF, 4.73 MB
english, 2005