SPIE Proceedings [SPIE Asia-Pacific Optical Communications - Shanghai, China (Sunday 6 November 2005)] Passive Components and Fiber-based Devices II - Ultra-thin metallic foil thickness measurement system using fiber optic low-coherence interferometry
Du, Yanli, Sun, Yan, Chen, Jianping, Yan, Huimin, Nie, Yongjun, Lee, Sang Bae, White, Ian H., Zhang, XiudaVolume:
6019
Year:
2005
Language:
english
DOI:
10.1117/12.635509
File:
PDF, 145 KB
english, 2005