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SPIE Proceedings [SPIE Smart Structures and Materials - San Diego, CA (Sunday 26 February 2006)] Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems - Application of outlier analysis for baseline-free damage diagnosis
Kim, Seung Dae, Tomizuka, Masayoshi, Yun, Chung-Bang, In, Chi Won, Cronin, Kelly E., Giurgiutiu, Victor, Sohn, Hoon, Harries, KentVolume:
6174
Year:
2006
Language:
english
DOI:
10.1117/12.658285
File:
PDF, 693 KB
english, 2006