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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Thermal temperature measurement and dynamic analysis based on USB 2.0
Wang, Lingxue, Hou, Xun, Yuan, Jiahu, Shi, Shiming, Jin, Weiqi, Wyant, James C., Wang, Hexin, Ding, Kun, Zhao, Yuanmeng, Han, Sen, Wang, XiaVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.678092
File:
PDF, 347 KB
english, 2005