SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Research on automatic detection method of non-uniform reflective metal sphere's surface flaws
Lu, Jianwei, Fang, Jiancheng, Wang, Zhongyu, Zhao, Huijie, Qu, YufuVolume:
6357
Year:
2006
Language:
english
DOI:
10.1117/12.716749
File:
PDF, 430 KB
english, 2006