![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic technology, and Artificial Intelligence - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Research of the new optical diffractive super-resolution element of the two-photon microfabrication
Wei, Peng, Fang, Jiancheng, Wang, Zhongyu, Zhu, Yu, Duan, GuanghongVolume:
6357
Year:
2006
Language:
english
DOI:
10.1117/12.717280
File:
PDF, 281 KB
english, 2006