SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Modeling Aspects in Optical Metrology - Modeling of image formation of a low-cost white-light bench microscope with a linear CMOS image sensor: its application in metrology
Macedo, Milton P., Bosse, Harald, Bodermann, Bernd, Barata, António J., Fernandes, Ana G., Silver, Richard M., Correia, Carlos M.Volume:
6617
Year:
2007
Language:
english
DOI:
10.1117/12.726392
File:
PDF, 354 KB
english, 2007