![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Optical Measurement Systems for Industrial Inspection V - Two-dimensional method for surface determination by optical deflectometry
Moreno, A., Osten, Wolfgang, Gorecki, Christophe, Espínola, M., Lizana, A., Novak, Erik L., Campos, J.Volume:
6616
Year:
2007
Language:
english
DOI:
10.1117/12.729630
File:
PDF, 256 KB
english, 2007