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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Optical Manufacturing and Testing VII - Segmented wave-front measurements by lateral shearing interferometry
Toulon, Bruno, Burge, James H., Faehnle, Oliver W., Primot, Jérôme, Guérineau, Nicolas, Williamson, Ray, Velghe, Sabrina, Haïdar, RiadVolume:
6671
Year:
2007
Language:
english
DOI:
10.1117/12.731584
File:
PDF, 479 KB
english, 2007