![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Edge detection of grain image and algorithm of extra work
Wang, Yunshan, Pan, Junhua, Wyant, James C., Qin, Bin, Si, Shuchun, Wang, HexinVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.782694
File:
PDF, 320 KB
english, 2007