SPIE Proceedings [SPIE 3rd International Symposium on...

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SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Ferroelectric properties of multi-layer LiTaO 3 thin films with Ta 2 O 5 buffer

Zhang, De-Yin, Yang, Li, Chen, Yaolong, Peng, Wei-Dong, Li, Jin-Hua, Kley, Ernst-Bernhard, Li, Rongbin, Li, Kun, Huang, Da-Gui
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Volume:
6722
Year:
2007
Language:
english
DOI:
10.1117/12.782838
File:
PDF, 525 KB
english, 2007
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