SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Quality estimation of thick-film resistor terminations based on electrical parameters extraction
Kiełbasiński, Konrad, Jakubowska, Małgorzata, Kalenik, Jerzy, Młożniak, Anna, Romaniuk, Ryszard S.Year:
2012
Language:
english
DOI:
10.1117/12.784705
File:
PDF, 301 KB
english, 2012