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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, CA (Sunday 18 January 2009)] Sensors, Cameras, and Systems for Industrial/Scientific Applications X - Packaging and characterization of orthogonal transfer array CCDs for the WIYN One Degree Imager
Lesser, Michael, Bodegom, Erik, Nguyen, Valérie, Ouellette, David, Zareba, Grzegorz, Jacoby, George, Muller, Gary, Sawyer, David, Keyes, Joe, Bredthauer, Richard, Boggs, KaseyVolume:
7249
Year:
2009
Language:
english
DOI:
10.1117/12.805950
File:
PDF, 1.13 MB
english, 2009