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SPIE Proceedings [SPIE Ninth International Symposium on Laser Metrology - Unknown, Singapore (Monday 30 June 2008)] Ninth International Symposium on Laser Metrology - Sub-pixel matching with consideration of lens distortion
Dong, Shihao, Quan, Chenggen, Asundi, Anand, Zhao, Xiaobo, Yin, Yongkai, Tian, Jindong, Peng, XiangVolume:
7155
Year:
2008
Language:
english
DOI:
10.1117/12.814591
File:
PDF, 133 KB
english, 2008