SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] EUV and X-Ray Optics: Synergy between Laboratory and Space - Requirements on hard x-ray grazing incidence optics for European XFEL: analysis and simulation of wavefront transformations
Samoylova, Liubov, Hudec, René, Pina, Ladislav, Sinn, Harald, Siewert, Frank, Mimura, Hidekazu, Yamauchi, Kazuto, Tschentscher, ThomasVolume:
7360
Year:
2009
Language:
english
DOI:
10.1117/12.822251
File:
PDF, 944 KB
english, 2009