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SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV - Constanta, Romania (Thursday 28 August 2008)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV - Jitter measurements in a 1550 nm mode-locked laser
Schiopu, Paul, Drăgulinescu, Andrei, Herda, Robert, Panait, Cornel, Caruntu, George, Guină, Mircea, Manea, AdrianVolume:
7297
Year:
2008
Language:
english
DOI:
10.1117/12.823624
File:
PDF, 173 KB
english, 2008