![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optical Inspection and Metrology for Non-Optics Industries - Iterative estimation of the topography by means of structured light
Martínez García, Amalia, Huang, Peisen S., Yoshizawa, Toru, Rayas-Alvarez, Juan Antonio, Puga Soberanes, Héctor José, Harding, Kevin G., Genovese, KatiaVolume:
7432
Year:
2009
Language:
english
DOI:
10.1117/12.825658
File:
PDF, 1.35 MB
english, 2009