SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on interferometry with grating modulating optical fiber interference fringes phase
Dai, Qiang, Zhang, Yudong, Wyant, James C., Xu, Yande, Liang, Yijun, Smythe, Robert A., Wang, Hexin, Geng, Tao, Zhu, Ronggang, Li, WenVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828784
File:
PDF, 298 KB
english, 2008