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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications - Analysis of the influence of conducting mesh for infrared optical system
Wang, Ye, Puschell, Jeffery, Gong, Hai-mei, Cai, Yi, Lu, Jin, Fei, Jin-dongVolume:
7383
Year:
2009
Language:
english
DOI:
10.1117/12.835506
File:
PDF, 246 KB
english, 2009