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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - A study of moment invariants based on pattern recognition
Wang, Yunhui, Yoshizawa, Toru, Wei, Ping, Ma, Junshan, Sun, Jun, Zheng, JesseVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.837818
File:
PDF, 270 KB
english, 2009