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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Target recognition and tracking method for one-off aerial imaging system
Ge, Shu-le, Yoshizawa, Toru, Wei, Ping, Xu, Ting-fa, Ni, Guo-qiang, Zheng, Jesse, Liu, Ying-huiVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.837917
File:
PDF, 4.15 MB
english, 2009