SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Micro- and Nanometrology III - An optical microform calibration system for ball-shaped hardness indenters
Li, Zhi, Gorecki, Christophe, Asundi, Anand K., Gao, Sai, Herrmann, Konrad, Osten, WolfgangVolume:
7718
Year:
2010
Language:
english
DOI:
10.1117/12.854800
File:
PDF, 770 KB
english, 2010