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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 1 August 2010)] Detectors and Imaging Devices: Infrared, Focal Plane, Single Photon - Radiation damage studies on a 5T sCMOS image sensor with integrated readout electronics
Rodricks, Brian, Dereniak, Eustace L., Hartke, John P., Fowler, Boyd, Lowes, John, LeVan, Paul D., Sood, Ashok K., Vu, Paul, Longshore, Randolph E., Razeghi, ManijehVolume:
7780
Year:
2010
Language:
english
DOI:
10.1117/12.862081
File:
PDF, 498 KB
english, 2010