SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on energy control system of film damage threshold testing by LabVIEW
Su, Jun-hong, Zhang, Yudong, Sasián, José, Cheng, Chun-juan, Xu, Jun-qi, Xiang, Libin, To, Sandy, Yang, Li-hong, Liu, Bao-yuanVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.865543
File:
PDF, 625 KB
english, 2010