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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Two-beam reflectance and transmittance measurement for "Shenguang-II" facility
Miao, Jie, Zhang, Yudong, Sasián, José, Yang, Pengqian, Zhu, Baoqiang, Xiang, Libin, Zhu, Janqiang, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.866832
File:
PDF, 786 KB
english, 2010