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SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Dynamic properties of speckled speckles
Hanson, Steen G., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Iversen, Theis Faber Quist F. Q., Hansen, René SkovVolume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.870934
File:
PDF, 369 KB
english, 2010