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SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Position and orientation measurement for large-size workpiece based on binocular vision
Liu, Fuguo, Harding, Kevin, Huang, Peisen S., Lou, Xiaoping, Lv, Naiguang, Yoshizawa, Toru, Sun, PengVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.871802
File:
PDF, 423 KB
english, 2010