SPIE Proceedings [SPIE Sixth International Symposium on...

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SPIE Proceedings [SPIE Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Hangzhou, China (Sunday 8 August 2010)] Sixth International Symposium on Precision Engineering Measurements and Instrumentation - Instrument for bearing fault diagnosis based on demodulated resonance technology

Lu, Yi, Hu, Xiao-feng, Zheng, Yong-jun
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Volume:
7544
Year:
2010
Language:
english
DOI:
10.1117/12.885315
File:
PDF, 306 KB
english, 2010
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