SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Videometrics, Range Imaging, and Applications XI - Accurate documentation in cultural heritage by merging TLS and high-resolution photogrammetric data

Grussenmeyer, Pierre, Remondino, Fabio, Shortis, Mark R., Alby, Emmanuel, Assali, Pierre, Poitevin, Valentin, Hullo, Jean-François, Smigiel, Eddie
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Volume:
8085
Year:
2011
Language:
english
DOI:
10.1117/12.890087
File:
PDF, 13.37 MB
english, 2011
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