SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications - The simple model of large scale co-ordinate measuring system and its error analysis
Cai, Hui-min, Zhu, Wei, Li, Ke-jie, Liu, Mei-lianVolume:
8194
Year:
2012
Language:
english
DOI:
10.1117/12.900595
File:
PDF, 1.67 MB
english, 2012