![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications - A high-speed CMOS image sensor with column-parallel single capacitor CDSs and single-slope ADCs
Li, Quanliang, Shi, Cong, Wu, NanjianVolume:
8194
Year:
2012
Language:
english
DOI:
10.1117/12.901005
File:
PDF, 481 KB
english, 2012