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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII - Laser speckle MTF processing and test development for VIS and IR sensors
Lee, Paul P. K., McMurtry, Craig W., Tan, Edwin J., Pipher, Judith L., Bocko, Mark V., Newman, J. Daniel, Holst, Gerald C., Krapels, Keith A.Volume:
8355
Year:
2012
Language:
english
DOI:
10.1117/12.919726
File:
PDF, 421 KB
english, 2012