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SPIE Proceedings [SPIE Holography Applications - Beijung, China (Wednesday 2 July 1986)] Holography Applications - A New Method Of Surface Roughness Measurement Using Far Field Speckle
Rong-ping, Liu, Pei-sen, Liu, Ke, Jingtang, Pryputniewicz, Ryszard J.Volume:
673
Year:
1988
Language:
english
DOI:
10.1117/12.939092
File:
PDF, 631 KB
english, 1988