SPIE Proceedings [SPIE 32nd Annual Technical Symposium -...

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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers - Tests Of Short Period X-Ray Multilayer Mirrors Using A Position Sensitive Proportional Counter

Dhez, P., Megtert, S., Ravet, M F., Ziegler, E, Christensen, Finn E.
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Volume:
984
Year:
1988
Language:
english
DOI:
10.1117/12.948774
File:
PDF, 252 KB
english, 1988
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