SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers - Tests Of Short Period X-Ray Multilayer Mirrors Using A Position Sensitive Proportional Counter
Dhez, P., Megtert, S., Ravet, M F., Ziegler, E, Christensen, Finn E.Volume:
984
Year:
1988
Language:
english
DOI:
10.1117/12.948774
File:
PDF, 252 KB
english, 1988