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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Multiple pulse train interference-based measurement of refractive index of air using a femtosecond optical frequency comb
Wei, Dong, Takamasu, Kiyoshi, Matsumoto, Hirokazu, Harding, Kevin G., Huang, Peisen S., Yoshizawa, ToruVolume:
8563
Year:
2012
Language:
english
DOI:
10.1117/12.999797
File:
PDF, 560 KB
english, 2012