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Effect of inelastic and elastic energy losses of Xe ions on the evolution of hydrogen blisters in silicon
Reutov, V. F., Dmitriev, S. N., Sokhatskii, A. S., Zaluzhnyi, A. G.Volume:
61
Language:
english
Journal:
Technical Physics
DOI:
10.1134/S1063784216010163
Date:
January, 2016
File:
PDF, 712 KB
english, 2016