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Checking and inferring local non-aliasing
Aiken, Alex, Foster, Jeffrey S., Kodumal, John, Terauchi, TachioVolume:
38
Language:
english
Journal:
ACM SIGPLAN Notices
DOI:
10.1145/780822.781146
Date:
May, 2003
File:
PDF, 161 KB
english, 2003