Quantifying Measurement Fluctuations from Stochastic...

Quantifying Measurement Fluctuations from Stochastic Surface Processes on Sensors with Heterogeneous Sensitivity

Charmet, Jérôme, Michaels, Thomas C. T., Daly, Ronan, Prasad, Abhinav, Thiruvenkathanathan, Pradyumna, Langley, Robin S., Knowles, Tuomas P. J., Seshia, Ashwin A.
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Volume:
5
Language:
english
Journal:
Physical Review Applied
DOI:
10.1103/PhysRevApplied.5.064016
Date:
June, 2016
File:
PDF, 1.18 MB
english, 2016
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