Thermal conductance of thin film YIG determined using Bayesian statistics
Euler, C., Hołuj, P., Langner, T., Kehlberger, A., Vasyuchka, V. I., Kläui, M., Jakob, G.Volume:
92
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.92.094406
Date:
September, 2015
File:
PDF, 956 KB
english, 2015