Ion-beam sputtered amorphous silicon films for cryogenic...

Physical Review D 2015 / 9 Vol. 92; Iss. 6

Ion-beam sputtered amorphous silicon films for cryogenic precision measurement systems

Murray, Peter G., Martin, Iain W., Craig, Kieran, Hough, James, Robie, Raymond, Rowan, Sheila, Abernathy, Matt R., Pershing, Teal, Penn, Steven
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Volume:
92
Language:
english
Journal:
Physical Review D
DOI:
10.1103/PhysRevD.92.062001
Date:
September, 2015
File:
PDF, 1.09 MB
english, 2015
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