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Analysis of titanium dental implants after failure of osseointegration: Combined histological, electron microscopy, and X-ray photoelectron spectroscopy approach
A. Arys, C. Philippart, N. Dourov, Y. He, Q. T. Le, J. J. PireauxVolume:
43
Year:
1998
Language:
english
Pages:
13
DOI:
10.1002/(sici)1097-4636(199823)43:33.0.co;2-j
File:
PDF, 340 KB
english, 1998