SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography - Optical constants from mirror reflectivities measured at synchrotrons
Blake, Richard L., Davis, Jeffrey C., Burbine, T. H., Graessle, Dale E., Gullikson, Eric M., Hoover, Richard B., Walker II, Arthur B. C.Volume:
1742
Year:
1993
Language:
english
DOI:
10.1117/12.140603
File:
PDF, 258 KB
english, 1993