SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Laser Diode Technology and Applications V - Profiling of MOCVD- and MBE-grown VCSEL wafers for WDM sources
Sze, Theresa, Mahbobzadeh, A. M., Cheng, Julian, Hersee, Stephen D., Osinski, Marek, Brueck, Steven R. J., Malloy, Kevin J., Renner, DanielVolume:
1850
Year:
1993
Language:
english
DOI:
10.1117/12.146897
File:
PDF, 380 KB
english, 1993